Electron Microscopy
FEI Magellan 400
Category
SBF-SEM
, Single Photon
Facility
EMF MPI-CBG
Location
Room XYZ
Description
Serial block face SEM featuring an immersion objective.
Voltage
1-30 kV
Resolution in nm
1 nm
Magnification x
200 x
Link to Manual
Internal DDc ID
1355
Suitable for
- serial block face imaging
Gun
- FEG
Stage
motorized, Gatan 3View microtome
Movements: xy
Movements: xy
Detector
-
ETD
Type: secondary electrons -
TLD
Type: secondary electrons -
CBS
Type: back scattered electrons -
BSD
Type: back scattered electrons
Software
- iTEM