Electron Microscopy
JEOL
Jeol JSM 7500F
Category
SEM
, Single Photon
Facility
EMF & Histo CMCB
Location
Room -1.118 (CRTD)
Description
Cold field emission SEM for high resolution imaging
Voltage
0.1-30 kV
Resolution in nm
1 nm
Magnification x
1000000 x
Internal DDc ID
1316
Suitable for
- high resolution imaging
- surface imaging of metal sputtered samples
- surface imaging of unsputtered samples
Gun
- cold FEG
Stage
motorized, piezo-5 axis
Movements: tilt
Movements: tilt
Camera(s)
-
Infrared camera for sample positioning (Adobe)
Camera Mount: top
Camera Size: 1024 x 2048
Detector
-
SE in lower position
(FEI)
Type: secondary electrons -
TD
(JEOL)
Type: direct detection -
SE in lens position
Type: secondary electrons -
BSE
(FEI)
Type: back scattered electrons
Software
- TEM Center