Electron Microscopy
JEM 1400 Plus
Category
TEM
, Single Photon
Facility
EMF & Histo CMCB
Location
Room -1.115
Description
120 kV TEM with Picture overlay program for routine inspection and CLEM
Voltage
40 - 120 kV
Resolution in nm
380.2 nm
Magnification x
10x to 1 200 000x x
Suitable for
- automated acquisition
- CLEM
- routine inspection
- single particle imaging
- thin sections
Gun
- Tungsten/Lab6
Stage
motorized, Compustage 4 axes
Movements: xy
Movements: xy
Software
- TEM Center